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The purpose of this work was studying the processes of C60 films evaporation on Si and porousSi substrates. It was found that velocity of C60 condensation is higher on porous Si. Methods of atomic-forcemicroscopy (AFM) and scanning electronic microscopy (SEM) were used for investigation of C60condensation process. Mechanism of nucleation on porous Si is found to differ essentially from that on Si.The photoluminescence of C60/Si. C60/porous Si structures were measured before and after thermal treatment.Forming wideband phase with maximum of photoluminescence at 440 nm were shown. Photoluminescenceintensity of porous Si structures is higher.
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