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Работа направлена на развитие дифракции синхротронного излучения как инструмента изучения нанодоменных конфигураций в тонкопленочных структурах цирконата свинца. Метод, описанный в этой работе, показал свою результативность в вопросе идентификации нанодеформаций, которые оказывают большое влияние на функциональное поведение материала и форму доменов.
The work aims to the development of diffraction of synchrotron radiation as a technique for nanoscopic analysis of domain mechanisms within thin films of lead zirconate. The method described in this work showed its capability of identifying the nanodeformations, which represent a great influence on the functional behavior of the material, on the shape of the domains.
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