Детальная информация
Название | Nano and microstructural design of advanced materials: a commemorative volume on professor G. Thomas' seventieth birthday |
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Другие авторы | Meyers M. A.; Ritchie R. O.; Sarikaya M. |
Выходные сведения | Amsterdam [etc.]: Elsevier Ltd. (Elsevier Science), 2003 |
Коллекция | Электронные книги зарубежных издательств; Общая коллекция |
Тематика | Наноструктурные материалы; Электронная микроскопия |
УДК | 620.22-022.53; 537.533.35 |
Тип документа | Другой |
Тип файла | Другой |
Язык | Английский |
Права доступа | Доступ из локальной сети ФБ СПбПУ (чтение, печать, копирование) |
Ключ записи | RU\SPSTU\edoc\52618 |
Дата создания записи | 23.04.2018 |
The importance of the nanoscale effects has been recognized in materials research for over fifty years, but it is only recently that advanced characterization and fabrication methods are enabling scientists to build structures atom-by-atom or molecule-by molecule. The understanding and control of the nanostructure has been, to a large extent, made possible by new atomistic analysis and characterization methods pioneered by transmission electron microscopy. Nano and Microstructural Design of Advanced Materials focuses on the effective use of such advanced analysis and characterization techniques in the design of materials. Teaches effective use of advanced analysis and characterization methods at an atomistic level. Contains many supporting examples of materials in which such design concepts have been successfully applied.
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