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Fujiwara, Hideo. Logic testing and design for testability / Hideo Fujiwara. — Cambridge, Massachusetts; London, England: MIT Press, 1985. — 1 PDF (x, 284 p.): ill. — (Computer systems series). — Доступ по паролю из сети Интернет (чтение, печать). — Mode of access: World Wide Web. — <URL:https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264>. — Текст: электронный
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