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Annotation
В ходе данной работы было проведено изучение топографии поверхности тонких углеродных пленок, а также тонких пленок молибдена. Для тонких пленок молибдена были получены вольт-амперные характеристики разных точках образца, была изучена фоточувствительность островковых структур образца. По данным вольт-амперных характеристик были рассчитаны туннельные спектры.
In the course of this work, surface topography of the thin carbon films and thin molybdenum films was investigated. For thin films of molybdenum, the volt-ampere characteristics of different points of the sample were obtained, and the photosensitivity of islet structures of the sample was studied. According to the current-voltage characteristics, calculations of tunneling spectra were performed.
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