Details
| Title | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra |
|---|---|
| Creators | Mikhailov Igor F.; Baturin Alexey A.; Mikhailov Anton I. |
| Collection | Электронные книги зарубежных издательств; Общая коллекция |
| Subjects | Fluorescence spectroscopy.; X-ray spectroscopy.; X-rays — Diffraction.; Materials — Analysis.; EBSCO eBooks |
| Document type | Other |
| File type | |
| Language | English |
| Rights | Доступ по паролю из сети Интернет (чтение, печать, копирование) |
| Record key | on1132421415 |
| Record create date | 2/1/2020 |
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| Group | Anonymous |
|---|---|
| Network | Internet |
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physi.
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| ILC SPbPU Local Network | All |
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| Internet | Authorized users SPbPU |
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| Internet | Anonymous |
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