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Table Card RUSMARC
Title: Rietveld refinement: practical pattern analysis using TOPAS
Creators: Dinnebier Robert E.,
Organization: ProQuest (Firm)
Collection: Электронные книги зарубежных издательств; Общая коллекция
Subjects: Rietveld method.; X-rays — Diffraction.; Crystallography.; EBSCO eBooks
Document type: Other
File type: PDF
Language: English
Rights: Доступ по паролю из сети Интернет (чтение, печать, копирование)
Record key: on1096221238

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Table of Contents

  • Preface
  • Contents
  • 1. The powder diffraction method
  • 2. The Rietveld method
  • 3. Structure independent fitting
  • 4. Peak shapes: Instrument o microstructure
  • 5. Quantitative phase analysis
  • 6. Restraints, constraints and rigid bodies
  • 7. Solving crystal structures using the Rietveld method
  • 8. Symmetry mode refinements
  • 9. Magnetic refinements
  • 10. Stacking disorder
  • 11. Total scattering methods
  • 12. Multiple data sets
  • 13. Appendix: Mathematical basics
  • Index

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